Langer EMV-Technik GmbH
Advanced state-of-the-art analysis methods for the optimal development of ICs - EMC and IC security
Friday, December 13 | 10:30 am - 11:20 am
Hall4 (East Hall4 Show Office)
Langer EMV-Technik introduces its EMC test methods at IC level for conducted and radiated emissions (1/150 Ohm, radiation measurement resolution up to 100 u) and conducted and radiated immunity (DPI, EFT, ESD). We also demonstrate IC security methods like EM side-channel analysis (SCA) and EMFI.